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Bulgarian Journal of Physics
Print: 1310-0157 Online: 1314-2666
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RECOGNIZED BY THE EUROPEAN PHYSICAL SOCIETY 
Bulg. J. Phys. vol.36 no.2 (2009), pp. 111-123
Analytical Approach to the Gaussian Beam Reflection from a Conducting Step
H. Stoyanov, N. Gorunski
Department of Quantum Electronics, Faculty of Physics, University of Sofia, 5, James Bourchier Blvd, Sofia 1164, Bulgaria
go backDepartment of Quantum Electronics, Faculty of Physics, University of Sofia, 5, James Bourchier Blvd, Sofia 1164, Bulgaria
Abstract. The recent investigations studied the interaction of a focused Gaussian beam with a phase step directly from the Fresnel-Kirchhoff integral approximation. The present paper approaches the problem of reflection of collimated Gaussian beam from a conducting step more rigorously. The theoretical deductions, based on the Maxwell equations, are compared with the experimental data. The object of investigation is a surface profile made by evaporation of thin Tantalum film on Silicon support.