Abstract. A two-resonator method, based on TE₀₁₁-mode and TM₀₁₀-mode resonance cavities with a disk sample has been developed for measurement of the longitudinal and transversal dielectric constants and dielectric loss tangent of dielectric substrates (dielectric anisotropy), used in modern electronics. The theoretical background of the method is presented: the analytical expressions of the dispersion equations for the considered modes in both cavities and expressions of the energy balance for computation of the permittivity and the dielectric loss tangent of the unknown sample in two directions. The sensitivity and the measurement errors are discussed. Practical examples are given for illustration of the dielectric anisotropy characterization of modern reinforced substrates with built-in woven glass cloth and filling plastics or powders.

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