Bulg. J. Phys. vol.16 no.3 (1989), pp. 349-354
Scanning Tunneling Microscope
P.R. Stankov1, S.I. Vasilev2
1Institute of Electronics, Bulgarian Academy of Sciences, 1784 Sofia
2Moscow State University, Moscow
go back1Institute of Electronics, Bulgarian Academy of Sciences, 1784 Sofia
2Moscow State University, Moscow
Abstract. In this paper we describe our new construction of a high-stability scanning tunneling microscope with a mechanical shift of the investigated object towards the emitting probe which has a vertical resolution of δz ≤ 0.3 Å and a horizontal resolution {x, y} ∼ 3-4 Å.
(in Russian)

